Scanning Electron Microscope (SME)
The scanning electron microscope (SEM) is a type of electron microscope capable of producing high-resolution images of a sample surface. The scanning electron microscope has various advantages over traditional microscopes. The SEM has a large depth of field, which allows a larger fraction of the specimen to be focused at one time. The high-powered indirect microscope produces an image by bombarding a sample with a beam of high-energy electrons. The electrons emitted from the sample are then scanned to form a magnified image which allows the examination of the structure, relief, and morphology of materials at between 20? and 50,000? magnification. SEMs also have a facility to analyse the X-rays given off by the target as a result of its bombardment and, as each element in the periodic table produces its own X-ray spectrum, this can be used to determine the elemental content of the sample. GT has the capabilities to provide and administer In house tests using our own SEM machine. We are able to provide this service to various industries. This also ensures the highest levels of quality in our finishing and shot peening processes.
- High Resolution Image
- 2D & 3D Micro Characterization
- Macro Sample to Nanometer Metrology
- Particle Detection and Characterization
- Dynamic Materials Experiments
EDX is the measurement of X-rays emitted during electron bombardment in an electron microscope (SEM or TEM). This is to determine the chemical composition of materials on micro and nano-scales. By determining the Xrays emitted from the area being energized by the electron beam, the elements present in the sample can be determined. The rate of detection of these characteristic X-rays is used to measure the amount of elements present in the sample. If the electron beam is rastered over an area of the sample, then the EDX systems can also acquire X-ray maps showing spatial variation of elements in the sample, then EDX systems can also acquire X-ray maps showing spatial variation of elements in the sample.
- Circuit Edit
- 3D Metrology
- Defect Analysis
- Failure analysis
- Materials Qualification
- Materials and Sample Preparation
- Device Testing and Characterization